New 20/20 Solar™ Microspectrophotometer for Solar Photovoltaic Cell Testing 24 Jun 2010: The 20/20 Solar™ from CRAIC Technologies is designed to measure the thickness of thin films as well as the optical efficiencies and clarity of photovoltaic cells. This can be done by both transmission and reflectance whether the solar cells are the traditional crystalline silicon substrates or one of the thin film varieties. CRAIC Technologies
New 20/20 Film™ Microspectrophotometer for Determining Film Thickness 22 Jun 2010: CRAIC Technologies announces the 20/20 Film™ microspectrophotometer, designed to measure the thickness of thin films of even sub-micron sampling areas rapidly and non-destructively. Able to analyze films of many materials on both transparent and opaque substrates, the 20/20 Film™ can determine thin film thickness on everything from semiconductors to MEMS devices to hard disk drives to flat panel displays. CRAIC Technologies
01 Sep 2010: The 308 PV™ UV-visible-NIR spectrophotometer from CRAIC Technologies is designed to be added to an open photoport of a microscope or probe station and analyze the spectra of many types of microscopic samples non-destructively.
26 Jul 2010: The new 64-bit version of ImageUV™ imaging software package from CRAIC Technologies is designed to collect, analyze and process images from CRAIC microscopes and microspectrophotometers running 64-bit versions of Windows 7®.
24 Jun 2010: The 20/20 Solar™ from CRAIC Technologies is designed to measure the thickness of thin films as well as the optical efficiencies and clarity of photovoltaic cells. This can be done by both transmission and reflectance whether the solar cells are the traditional crystalline silicon substrates or one of the thin film varieties.
22 Jun 2010: CRAIC Technologies announces the 20/20 Film™ microspectrophotometer, designed to measure the thickness of thin films of even sub-micron sampling areas rapidly and non-destructively. Able to analyze films of many materials on both transparent and opaque substrates, the 20/20 Film™ can determine thin film thickness on everything from semiconductors to MEMS devices to hard disk drives to flat panel displays.
